Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements
Crupi, F., Alioto, M., Franco, J., Magnone, P., Togo, M., Horiguchi, N., Groeseneken, G.Volume:
59
Year:
2012
Language:
english
Pages:
1
DOI:
10.1109/tcsii.2012.2200171
File:
PDF, 246 KB
english, 2012