[Springer Series in Chemical Physics] Ultrafast Phenomena XV Volume 88 || Carrier Dependent Stability of a Semiconductor Lattice Measured with Femtosecond X-ray Diffraction
Corkum, Paul, Jonas, David M., Miller, R. J. Dwayne., Weiner, Andrew M.Volume:
10.1007/97
Year:
2007
Language:
english
Pages:
3
DOI:
10.1007/978-3-540-68781-8_227
File:
PDF, 190 KB
english, 2007