SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Physics and Applications of Optoelectronic Devices - Internal efficiency analysis of 280-nm light emitting diodes
Piprek, Joachim, Moe, Craig G., Keller, Sarah L., Nakamura, Shuji, DenBaars, Steven P., Piprek, JoachimVolume:
5594
Year:
2004
Language:
english
Pages:
8
DOI:
10.1117/12.567084
File:
PDF, 118 KB
english, 2004