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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - The statistical analysis of individual defects constituting NBTI and its implications for modeling DC- and AC-stress
Reisinger, Hans, Grasser, Tibor, Gustin, Wolfgang, Schlunder, ChristianYear:
2010
Language:
english
Pages:
9
DOI:
10.1109/irps.2010.5488858
File:
PDF, 576 KB
english, 2010