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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Analytic modeling of the bias temperature instability using capture/emission time maps
Grasser, T., Wagner, P.-J., Reisinger, H., Aichinger, Th., Pobegen, G., Nelhiebel, M., Kaczer, B.Year:
2011
Language:
english
Pages:
1
DOI:
10.1109/iedm.2011.6131624
File:
PDF, 337 KB
english, 2011