Defect-induced structural disorder in tetragonal Cu(In1 xGax)5Se8 thin films investigated by Raman spectroscopy: the effect of Ga addition
Xu, Chuan-Ming, Huang, Wen-Hao, Xu, Jun, Yang, Xiao-Jie, Zuo, Jian, Xu, Xiao-Liang, Liu, Hong-TuVolume:
16
Year:
2004
Language:
english
Pages:
7
DOI:
10.1088/0953-8984/16/23/029
File:
PDF, 210 KB
english, 2004