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A study of single-layer and restacked MoS2 by X-ray diffraction and X-ray absorption spectroscopy
Joensen, P, Crozier, E D, Alberding, N, Frindt, R FVolume:
20
Year:
1987
Language:
english
Pages:
11
DOI:
10.1088/0022-3719/20/26/009
File:
PDF, 720 KB
english, 1987