Highly Compact Interconnect Test Patterns for Crosstalk and...

IEEE Transactions on Circuits and Systems II: Express Briefs 2009 Vol. 56; Iss. 5

Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults

Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park
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Volume:
56
Year:
2009
Language:
english
Pages:
424
DOI:
10.1109/tcsii.2009.2022373
File:
PDF, 385 KB
english, 2009
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