[IEEE 2008 IEEE National Aerospace and Electronics...

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[IEEE 2008 IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2008.07.16-2008.07.18)] 2008 IEEE National Aerospace and Electronics Conference - Relative Track Metrics to Determine Model Mismatch

Blasch, Erik, Rice, Andrew, Yang, Chun, Kadar, Ivan
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Year:
2008
Language:
english
Pages:
8
DOI:
10.1109/naecon.2008.4806556
File:
PDF, 469 KB
english, 2008
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