[IEEE 2008 IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2008.07.16-2008.07.18)] 2008 IEEE National Aerospace and Electronics Conference - Relative Track Metrics to Determine Model Mismatch
Blasch, Erik, Rice, Andrew, Yang, Chun, Kadar, IvanYear:
2008
Language:
english
Pages:
8
DOI:
10.1109/naecon.2008.4806556
File:
PDF, 469 KB
english, 2008