Markov Chain Analysis of Thermally Induced Soft Errors in...

Markov Chain Analysis of Thermally Induced Soft Errors in Subthreshold Nanoscale CMOS Circuits

Sabou, F.C., Kazazis, D., Bahar, R.I., Mundy, J., Patterson, W.R., Zaslavsky, A.
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Volume:
9
Year:
2009
Language:
english
Pages:
505
DOI:
10.1109/tdmr.2009.2026571
File:
PDF, 1.19 MB
english, 2009
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