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Markov Chain Analysis of Thermally Induced Soft Errors in Subthreshold Nanoscale CMOS Circuits
Sabou, F.C., Kazazis, D., Bahar, R.I., Mundy, J., Patterson, W.R., Zaslavsky, A.Volume:
9
Year:
2009
Language:
english
Pages:
505
DOI:
10.1109/tdmr.2009.2026571
File:
PDF, 1.19 MB
english, 2009