Statistical Analysis of ENOB and Yield in Binary Weighted...

IEEE Transactions on Circuits and Systems I: Regular Papers 2012 Vol. 59; Iss. 7

Statistical Analysis of ENOB and Yield in Binary Weighted ADCs and DACS With Random Element Mismatch

Fredenburg, J.A., Flynn, M.P.
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Volume:
59
Year:
2012
Language:
english
Pages:
1
DOI:
10.1109/tcsi.2011.2177006
File:
PDF, 1.92 MB
english, 2012
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