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The IEEE Reliability Test System-1996. A report prepared by the Reliability Test System Task Force of the Application of Probability Methods Subcommittee
Grigg, C., Wong, P., Albrecht, P., Allan, R., Bhavaraju, M., Billinton, R., Chen, Q., Fong, C., Haddad, S., Kuruganty, S., Li, W., Mukerji, R., Patton, D., Rau, N., Reppen, D., Schneider, A., ShahidehVolume:
14
Year:
1999
Language:
english
Pages:
1021
DOI:
10.1109/59.780914
File:
PDF, 913 KB
english, 1999