Direct Measurement of van der Waals and Diffuse Double-Layer Forces between Titanium Dioxide Surfaces Produced by Atomic Layer Deposition
Walsh, Rick B., Nelson, Andrew, Skinner, William M., Parsons, Drew, Craig, Vincent S. J.Volume:
116
Year:
2012
Language:
english
Pages:
10
DOI:
10.1021/jp300533m
File:
PDF, 3.06 MB
english, 2012