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[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Simulation and Analysis of EMC Chambers by Ray Tracing Method
Lin, Ming-Shing, Ji, Jia-Ming, Hsu, Chung. -I. G., Hsieh, Han-ChangYear:
2007
Language:
english
Pages:
4
DOI:
10.1109/isemc.2007.252
File:
PDF, 348 KB
english, 2007