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[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A Distributed Critical-Path Timing Monitor for a 65nm High-Performance Microprocessor
Drake, Alan, Senger, Robert, Deogun, Harmander, Carpenter, Gary, Ghiasi, Soraya, Nguyen, Tuyet, James, Norman, Floyd, Michael, Pokala, VikasYear:
2007
Language:
english
Pages:
2
DOI:
10.1109/isscc.2007.373462
File:
PDF, 2.34 MB
english, 2007