Condition Monitoring for Device Reliability in Power...

IEEE Transactions on Power Electronics 2010 Vol. 25; Iss. 11

Condition Monitoring for Device Reliability in Power Electronic Converters: A Review

Yang, S., Xiang, D., Bryant, A., Mawby, P., Ran, L., Tavner, P.
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Volume:
25
Year:
2010
Language:
english
Pages:
2753
DOI:
10.1109/tpel.2010.2049377
File:
PDF, 820 KB
english, 2010
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