In-flight and ground testing of single event upset...

IEEE Transactions on Nuclear Science 1998 Vol. 45; Iss. 3

In-flight and ground testing of single event upset sensitivity in static RAMs

Johansson, K., Dyreklev, P., Granbom, O., Calver, M.C., Fourtine, S., Feuillatre, O.
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Volume:
45
Year:
1998
Language:
english
Pages:
5
DOI:
10.1109/23.685251
File:
PDF, 461 KB
english, 1998
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