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Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits
Dodd, P. E., Schwank, J. R., Shaneyfelt, M. R., Felix, J. A., Paillet, P., Ferlet-Cavrois, V., Baggio, J., Reed, R. A., Warren, K. M., Weller, R. A.Volume:
54
Year:
2007
Language:
english
Pages:
9
DOI:
10.1109/tns.2007.909844
File:
PDF, 233 KB
english, 2007