Impact of Neutron-Induced Displacement Damage on the...

IEEE Transactions on Nuclear Science 2012 / 12 Vol. 59; Iss. 6

Impact of Neutron-Induced Displacement Damage on the Multiple Bit Upset Sensitivity of a Bulk CMOS SRAM

Gadlage, M. J., Kay, M. J., Duncan, A. R., Savage, M. W., Ingalls, J. D., Cruz-Rodriguez, D., Howard, A.
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Volume:
59
Language:
english
Pages:
7
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2218617
Date:
December, 2012
File:
PDF, 1.22 MB
english, 2012
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