[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Conductor profile effects on the propagation constant of microstrip transmission lines
Horn, Allen F., Reynolds, John W., Rautio, James CYear:
2010
Language:
english
Pages:
4
DOI:
10.1109/mwsym.2010.5515933
File:
PDF, 886 KB
english, 2010