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Multiple-Bit Upset Analysis in 90 nm SRAMs: Heavy Ions Testing and 3D Simulations
Roche, Philippe, Gasiot, Gilles, Harboe-Sorensen, Reno, Giot, DamienVolume:
54
Year:
2007
Language:
english
Pages:
8
DOI:
10.1109/tns.2007.902360
File:
PDF, 926 KB
english, 2007