![](/img/cover-not-exists.png)
The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons
Pellish, Jonathan A., Marshall, Paul W., LaBel, Kenneth A., Seifert, Norbert, Gill, BalkaranVolume:
58
Year:
2011
Language:
english
Pages:
8
DOI:
10.1109/tns.2011.2171004
File:
PDF, 992 KB
english, 2011