Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS
Atkinson, Nicholas M., Ahlbin, Jonathan R., Witulski, Arthur F., Gaspard, Nelson J., Holman, W. Timothy, Bhuva, Bharat L., Zhang, Enxia X., Chen, Li, Massengill, Lloyd W.Volume:
58
Year:
2011
Language:
english
Pages:
7
DOI:
10.1109/tns.2011.2168425
File:
PDF, 834 KB
english, 2011