[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Yield and Cost Analysis of a Reliable NoC
Shamshiri, Saeed, Cheng, Kwang-TingYear:
2009
Language:
english
Pages:
6
DOI:
10.1109/vts.2009.34
File:
PDF, 894 KB
english, 2009