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[IEEE 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - Hyderabad, India (2006.01.3-2006.01.7)] 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - Phase change memory faults
Mohammad, M.G., Terkawi, L., Albasman, M.Year:
2006
Language:
english
DOI:
10.1109/vlsid.2006.134
File:
PDF, 252 KB
english, 2006