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[ACM Press the 2012 ACM/IEEE international symposium - Redondo Beach, California, USA (2012.07.30-2012.08.01)] Proceedings of the 2012 ACM/IEEE international symposium on Low power electronics and design - ISLPED '12 - Design benchmarking to 7nm with FinFET predictive technology models
Sinha, Saurabh, Cline, Brian, Yeric, Greg, Chandra, Vikas, Cao, YuYear:
2012
Language:
english
DOI:
10.1145/2333660.2333666
File:
PDF, 4.33 MB
english, 2012