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[IEEE 2012 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Montreal, QC, Canada (2012.06.17-2012.06.19)] 2012 IEEE Radio Frequency Integrated Circuits Symposium - Characterization and modeling of enhanced voltage RF MESFETs on 45nm CMOS for RF applications
Wilk, Seth J., Ghajar, M. Reza, Lepkowski, William, Bakkaloglu, Bertan, Thornton, Trevor J.Year:
2012
Language:
english
Pages:
4
DOI:
10.1109/rfic.2012.6242311
File:
PDF, 256 KB
english, 2012