[IEEE 2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID) - Porto (2009.09.20-2009.09.25)] 2009 First International Conference on Advances in System Testing and Validation Lifecycle - Scenario-Based Test Case Generation Using Event-B Models
Malik, Q.A., Lilius, J., Laibinis, L.Year:
2009
Language:
english
Pages:
7
DOI:
10.1109/valid.2009.22
File:
PDF, 387 KB
english, 2009