[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - A low-cost and scalable test architecture for multi-core chips
Chi, Chun-Chuan, Wu, Cheng-Wen, Li, Jin-FuYear:
2010
Language:
english
Pages:
6
DOI:
10.1109/etsym.2010.5512784
File:
PDF, 414 KB
english, 2010