[IEEE 2011 IEEE 4th International Nanoelectronics Conference (INEC) - Tao-Yuan, Taiwan (2011.06.21-2011.06.24)] The 4th IEEE International NanoElectronics Conference - Study of temperature effects of mobility, swing, and early voltages on strained MOSFET devices
Yang, Hsin-Chia, Peng, Huei-Jyun, Liao, Wen-Shiang, Yeh, Jhe-Chuan, Wang, Mu-ChunYear:
2011
Language:
english
Pages:
2
DOI:
10.1109/inec.2011.5991777
File:
PDF, 252 KB
english, 2011