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[IEEE 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Bali, Indonesia (2006.06.26-2006.06.30)] 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Breakdown Electric Field Investigation Using the AC Breakdown&Simulation in Insulator for Ultra-High Voltage
Park, Hee-doo, Ahn, Byung-chul, Lee, Hyuk-jin, Shin, Jong-yeol, Kim, Gwi-yeol, Hong, Jin-woongYear:
2006
Language:
english
Pages:
4
DOI:
10.1109/icpadm.2006.284228
File:
PDF, 2.97 MB
english, 2006