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[IEEE 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity - Los Angeles, CA, USA (24-27 Jan. 2000)] Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) - G-renewal process as a model for statistical warranty claim prediction
Kaminskiy, M.P., Krivtsov, V.V.Year:
2000
Language:
english
Pages:
5
DOI:
10.1109/rams.2000.816321
File:
PDF, 405 KB
english, 2000