[IEEE Comput. Soc. Press European Design and Test...

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[IEEE Comput. Soc. Press European Design and Test Conference. ED & TC 97 - Paris, France (17-20 March 1997)] Proceedings European Design and Test Conference. ED & TC 97 - A CMOS low-voltage, high-gain op-amp

Lu, G.N., Sou, G.
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Year:
1997
Language:
english
Pages:
5
DOI:
10.1109/edtc.1997.582329
File:
PDF, 559 KB
english, 1997
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