Surface functionalization of PEEK films studied by...

Surface and Interface Analysis 1999 / 03 Vol. 27; Iss. 3

Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy

Henneuse-Boxus, Catherine, Poleunis, Claude, De Ro, Astrid, Adriaensen, Yasmine, Bertrand, Patrick, Marchand-Brynaert, Jacqueline
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Volume:
27
Language:
english
Pages:
11
Journal:
Surface and Interface Analysis
DOI:
10.1002/(sici)1096-9918(199903)27:33.0.co;2-6
Date:
March, 1999
File:
PDF, 279 KB
english, 1999
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