Effect of metal contamination on recombination properties of extended defects in multicrystalline Si
O. V. Feklisova, X. Yu, D. Yang, E. B. YakimovVolume:
aop
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/pssc.201200138
File:
PDF, 795 KB
english, 2012