Effect of metal contamination on recombination properties...

Effect of metal contamination on recombination properties of extended defects in multicrystalline Si

O. V. Feklisova, X. Yu, D. Yang, E. B. Yakimov
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Volume:
aop
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/pssc.201200138
File:
PDF, 795 KB
english, 2012
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