Distinct Processes in Line Bisection According to Severity...

Distinct Processes in Line Bisection According to Severity of Left Unilateral Spatial Neglect

Yasumasa Koyama, Sumio Ishiai, Keiko Seki, Takahiro Nakayama
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Volume:
35
Year:
1997
Language:
english
Pages:
282
DOI:
10.1006/brcg.1997.0943
File:
PDF, 154 KB
english, 1997
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