Depolarization near-field scanning optical microscopy: influence of wavelength and tip shape on the lateral resolution
von Freymann, G., Wegener, M., Schimmel, Th.Volume:
27
Language:
english
Pages:
4
Journal:
Surface and Interface Analysis
DOI:
10.1002/(sici)1096-9918(199905/06)27:5/63.0.co;2-h
Date:
May, 1999
File:
PDF, 96 KB
english, 1999