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Defects of Planarity of Carbon Films Supported on Electron Microscope Grids Revealed by Reflected Light Microscopy
Marc Schmutz, Jacques Lang, Sabine Graff, Alain BrissonVolume:
112
Year:
1994
Pages:
259
DOI:
10.1006/jsbi.1994.1025
File:
PDF, 863 KB
1994