Spectroscopic ellipsometry measurements of thin metal films
Tompkins, Harland G., Tasic, Sonja, Baker, Jeff, Convey, DianaVolume:
29
Language:
english
Pages:
9
Journal:
Surface and Interface Analysis
DOI:
10.1002/(sici)1096-9918(200003)29:33.0.co;2-o
Date:
March, 2000
File:
PDF, 151 KB
english, 2000