Positive secondary ion mass spectrum of poly(methyl...

Surface and Interface Analysis 2000 / 05 Vol. 29; Iss. 5

Positive secondary ion mass spectrum of poly(methyl methacrylate): a high mass resolution ToF-SIMS study

Briggs, David, Fletcher, Ian W., Gon�alves, Nancy M.
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Volume:
29
Language:
english
Pages:
7
Journal:
Surface and Interface Analysis
DOI:
10.1002/(sici)1096-9918(200005)29:53.0.co;2-5
Date:
May, 2000
File:
PDF, 114 KB
english, 2000
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