In-situ ellipsometric determination of thickness and optical constants of passive and transpassive films on alloy 600 in neutral solution
Shiro Matsuda, Toshihiro Kikuchi, Katsuhisa SugimotoVolume:
31
Year:
1990
Language:
english
Pages:
167
DOI:
10.1016/0010-938x(90)90104-d
File:
PDF, 298 KB
english, 1990