Improved event-related potential estimation using statistical pattern classification
Alan S Gevins, Nelson H Morgan, Steven L Bressler, Joseph C Doyle, Brian A CutilloVolume:
64
Year:
1986
Language:
english
Pages:
187
DOI:
10.1016/0013-4694(86)90111-2
File:
PDF, 638 KB
english, 1986