![](/img/cover-not-exists.png)
Test-retest reliability in EEG frequency analysis
M.C. Salinsky, B.S. Oken, L. MoreheadVolume:
79
Year:
1991
Language:
english
Pages:
393
DOI:
10.1016/0013-4694(91)90203-g
File:
PDF, 906 KB
english, 1991