Laser ablation and secondary ion mass spectrometry of inorganic transition-metal compounds. Part I: comparison between static ToF-SIMS and LA-FTICRMS
Frédéric Aubriet, Claude Poleunis, Jean-François Muller, Patrick BertrandVolume:
41
Year:
2006
Language:
english
Pages:
16
DOI:
10.1002/jms.1011
File:
PDF, 619 KB
english, 2006