Relation between system parameters and measured drift...

Relation between system parameters and measured drift mobilities in amorphous semiconductors

Guy J. Adriaenssens, Geert Seynhaeve
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
97-98
Year:
1987
Language:
english
Pages:
137
DOI:
10.1016/0022-3093(87)90031-7
File:
PDF, 170 KB
english, 1987
Conversion to is in progress
Conversion to is failed