Amient-induced defect states at a-Si:H/ITO interfaces
Martin Hoheisel, Norbert Brutscher, Herfried WieczorekVolume:
115
Year:
1989
Language:
english
Pages:
117
DOI:
10.1016/0022-3093(89)90378-5
File:
PDF, 175 KB
english, 1989