DLTS study of defect creation in amorphous-silicon...

DLTS study of defect creation in amorphous-silicon thin-film transistors

N. Nickel, W. Fuhs, H. Mell
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Volume:
115
Year:
1989
Language:
english
Pages:
162
DOI:
10.1016/0022-3093(89)90391-8
File:
PDF, 212 KB
english, 1989
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