Some effects of 5 eV photons on defects in SiO2

Some effects of 5 eV photons on defects in SiO2

R.A. Weeks, R.H. Magruder III, P.W. Wang
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Volume:
149
Year:
1992
Language:
english
Pages:
137
DOI:
10.1016/0022-3093(92)90061-n
File:
PDF, 1.07 MB
english, 1992
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