Defect determination kinetics during the growth of a-Si:H
Toshihiro Kamei, Gautam Ganguly, Nobuhiro Hata, Akihisa MatsudaVolume:
164-166
Year:
1993
Language:
english
Pages:
47
DOI:
10.1016/0022-3093(93)90487-i
File:
PDF, 310 KB
english, 1993