Structural analysis of amorphous thin films by time of flight mass spectrometry
Seiji Tsuboi, Mitsutaka Matsuse, Masashi Kawasaki, Akihisa Matsuda, Hideomi KoinumaVolume:
198-200
Year:
1996
Language:
english
Pages:
36
DOI:
10.1016/0022-3093(95)00650-8
File:
PDF, 281 KB
english, 1996